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Volume 143

Number 1

The Effect of Random Geometry on the Criticality of a Multiplying System IV: Transport Theory

M. M. R. Williams

Nuclear Science and Engineering / Volume 143 / Number 1 / January 2003 / Pages 1-18

Technical Paper / dx.doi.org/10.13182/NSE03-A2314

Perturbation Theory for Lattice Cell Calculations

T. Courau, G. Marleau

Nuclear Science and Engineering / Volume 143 / Number 1 / January 2003 / Pages 19-32

Technical Paper / dx.doi.org/10.13182/NSE02-11

A Neutronic Program for Critical and Nonequilibrium Study of Mobile Fuel Reactors: The Cinsf1D Code

David Lecarpentier, Vincent Carpentier

Nuclear Science and Engineering / Volume 143 / Number 1 / January 2003 / Pages 33-46

Technical Paper / dx.doi.org/10.13182/NSE03-A2316

An Angular Leakage Correction for Modeling a Hemisphere, Using One-Dimensional Spherical Coordinates

K. N. Schwinkendorf, C. S. Eberle

Nuclear Science and Engineering / Volume 143 / Number 1 / January 2003 / Pages 47-60

Technical Paper / dx.doi.org/10.13182/NSE03-A2317

The Characteristics and Subgroup Methods in Square Light Water Reactor Cell Calculations

Tadashi Ushio, Toshikazu Takeda, Masaaki Mori

Nuclear Science and Engineering / Volume 143 / Number 1 / January 2003 / Pages 61-80

Technical Note / dx.doi.org/10.13182/NSE03-A2318

Elastic Scattering of Heavy Projectiles by Light Targets

Raymond L. Murray

Nuclear Science and Engineering / Volume 143 / Number 1 / January 2003 / Pages 81-85

Technical Note / dx.doi.org/10.13182/NSE03-A2319

Measurement of Differential Cross Sections of the 6Li(n,t)4He Reaction at 1.85 and 2.67 MeV

Guohui Zhang, Guoyou Tang, Jinxiang Chen, Zhaomin Shi, Zemin Chen, Yu. M. Gledenov, M. Sedysheva, G. Khuukhenkhuu

Nuclear Science and Engineering / Volume 143 / Number 1 / January 2003 / Pages 86-89

Technical Note / dx.doi.org/10.13182/NSE03-A2320

Calculations for Proton-Induced Reactions Below 250 MeV on 208Pb and 209Bi Targets

Zhengjun Zhang, Xiuquan Sun, Chonghai Cai, Qingbiao Shen, Yinlu Han

Nuclear Science and Engineering / Volume 143 / Number 1 / January 2003 / Pages 90-98

Technical Note / dx.doi.org/10.13182/NSE03-A2321