ANS / Publications / Journals / Nuclear Science and Engineering

Criticality and Reactivity Measurement Method for Nuclear Material Control and Accountability

N. N. Ponomarev-Stepnoi, Y. S. Glushkov, V. P. Garin, G. V. Kompaniets, V. I. Nosov, R. G. Sanchez, R. R. Paternoster, S. P. Gary

Nuclear Science and Engineering / Volume 144 / Number 3 / July 2003 / Pages 191-199

Technical Paper / dx.doi.org/10.13182/NSE03-A2352

A Numerical Method for Computing Collision, Escape, and Transmission Probabilities in Three Dimensions

R. D. M. Garcia

Nuclear Science and Engineering / Volume 144 / Number 3 / July 2003 / Pages 200-210

Technical Paper / dx.doi.org/10.13182/NSE03-A2353

Effects of Nuclear Data Library on BFS and ZPPR k_eff Analysis Results

Gennadi Manturov

Nuclear Science and Engineering / Volume 144 / Number 3 / July 2003 / Pages 211-218

Technical Paper / dx.doi.org/10.13182/NSE03-A2354

The Fragment Distribution of Nb, Au, and Pb from Proton-Induced Reactions with Energies Ranging from 100 MeV to 3 GeV

S. Fan, J. Rong, H. Zhang, Z. Zhao

Nuclear Science and Engineering / Volume 144 / Number 3 / July 2003 / Pages 219-226

Technical Paper / dx.doi.org/10.13182/NSE03-A2355

Characterization of a Source Importance Function in an Accelerator-Driven System

Yonghee Kim, Won Seok Park, Chang Kue Park

Nuclear Science and Engineering / Volume 144 / Number 3 / July 2003 / Pages 227-241

Technical Paper / dx.doi.org/10.13182/NSE03-A2356

An Investigation of Power Stabilization and Space-Dependent Dynamics of a Nuclear Fluidized-Bed Reactor

Christopher C. Pain, Matthew D. Eaton, Jefferson L. M. A. Gomes, Cassiano R. E. de Oliveira, Adrian P. Umpleby, Kemal Ziver, Ron T. Ackroyd, Bryan Miles, Antony J. H. Goddard, H. van Dam, T. H. J. J. van der Hagen, D. Lathouwers

Nuclear Science and Engineering / Volume 144 / Number 3 / July 2003 / Pages 242-257

Technical Note / dx.doi.org/10.13182/NSE03-A2357

Dynamic Adsorption of Noble Gases

Dwight Underhill

Nuclear Science and Engineering / Volume 144 / Number 3 / July 2003 / Pages 258-260

Technical Note / dx.doi.org/10.13182/NSE03-A2358