A Step-Heating Dilatometry Method to Measure the Change in Length Due to Annealing of a SiC Temperature Monitor

Toyohiko Yano; Kazunari Sasaki; Tadashi Maruyama; Takayoshi Iseki; Masahiko Ito; Shoji Onose

doi:dx.doi.org/10.13182/NT91-A34535

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Home / Publications / Journals / Nuclear Technology / Volume 93 / Number 3

A Step-Heating Dilatometry Method to Measure the Change in Length Due to Annealing of a SiC Temperature Monitor

Toyohiko Yano, Kazunari Sasaki, Tadashi Maruyama, Takayoshi Iseki, Masahiko Ito, Shoji Onose

Nuclear Technology / Volume 93 / Number 3 / March 1991 / Pages 412-415

Technical Note / Material / dx.doi.org/10.13182/NT91-A34535

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A simple method to measure the change in length of a silicon carbide temperature monitor due to annealing is presented. A differential dilatometer is used to detect the change in length of an irradiated specimen as the temperature of the specimen is raised in steps. The results obtained by this step-heating dilatometry method are in good agreement with measurements obtained with an X-ray diffractometer and a micrometer.