X-Ray Photoelectron Spectroscopy Studies of Silicate Glasses: Implications to Bonding and Leaching

B. W. Veal; D. J. Lam; A. P. Paulikas; D. P. Karim

doi:dx.doi.org/10.13182/NT80-A32592

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X-Ray Photoelectron Spectroscopy Studies of Silicate Glasses: Implications to Bonding and Leaching

B. W. Veal, D. J. Lam, A. P. Paulikas, D. P. Karim

Nuclear Technology / Volume 51 / Number 2 / December 1980 / Pages 136-142

Technical Paper / Argonne National Laboratory Specialists’ Workshop on Basic Research Needs for Nuclear Waste Management / Radioactive Waste / dx.doi.org/10.13182/NT80-A32592

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X-ray photoelectron spectroscopy can be applied to the study of bonding properties of metal oxides in silicate glasses and to the analysis of water-leached glass surfaces. The addition of CaO to Na₂O-2SiO₂ results in a decrease in the number of bridging oxygen atoms in the glass matrix as monitored by oxygen 1s peak intensities. In sodium disilicate glasses containing dissolved uranium, significantly different leaching behavior can occur, depending on the oxidation state of the uraniumions.