Direct Electron Excitation in Isotopic X-Ray Fluorescent Analysis

Troy C. Martin; Kenneth R. Blake; I. L. Morgan

doi:dx.doi.org/10.13182/NT67-A27843

/Create an Account

About
ANS
Membership
Meetings
Publications
Standards
Public
Information
Communities
Honors &
Awards
Nuclear
Careers
Advertising

Home / Publications / Journals / Nuclear Technology / Volume 3 / Number 7

Direct Electron Excitation in Isotopic X-Ray Fluorescent Analysis

Troy C. Martin, Kenneth R. Blake, I. L. Morgan

Nuclear Technology / Volume 3 / Number 7 / July 1967 / Pages 444-445

Technical Paper and Note / Technical Note / dx.doi.org/10.13182/NT67-A27843

pdf View or Purchase Article

Articles are hosted by Taylor and Francis Online.

A method for increasing the sensitivity of the isotopic x-ray fluorescence technique of elemental analysis is described. A vacuum path and an accelerating potential are utilized to permit fluorescent x-ray production in the sample by the β particles from the source.