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Variance Reduction Under Exponential and Scattering Angle Biasing: An Analytic Approach

R. Indira, T. M. John

Nuclear Science and Engineering / Volume 94 / Number 4 / December 1986 / Pages 323-336

Technical Paper / dx.doi.org/10.13182/NSE86-A18344

An analytic approach to calculate variance reduction under analog and biased Monte Carlo simulation of deep-penetration problems is presented. Within the framework of this formulation, the variance reduction characteristics of exponential biasing and a recently proposed scheme that couples exponential biasing to scattering angle biasing are studied. The advantages and disadvantages of the coupled scheme over exponential biasing on deep-penetration problems with varying scattering probability and anisotropy are clearly illustrated.