Effects of Fusion Produced Neutrons on Semiconductor Detectors

Detailed plasma-physics investigations by the use of x-ray-tomography data supported by the fundamental theoretical studies of x-ray-detector responses enhance the importance of x-ray diagnostics for fusion-plasma analyses. However, degradation in responses of semiconductor x-ray detectors after fusion-produced neutron exposure still remains one of the most serious problems in recent fusion experiments even at this time. For the purpose of investigating and characterizing neutron effects on semiconductor x-ray detectors, detection characteristics of n-type silicon semiconductor detectors which are similar to those utilized for x-ray-tomography detectors in the Joint European Torus (JET) tokamak, are studied by the use of synchrotron radiation from a 2.5-GeV positron storage ring at the Photon Factory. The fusion neutronics source (FNS) of Japan Atomic Energy Research Institute is employed as well-calibrated deuterium-tritium (D-T) neutron source with fluences from 10¹³ to 10¹⁵ neutrons/cm² onto these semiconductor detectors. Degradation in x-ray responses with increasing neutron fluences has been reported; however, our recent detailed investigations of detector responses show nonlinear dependence as a function of the neutron fluence.