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Impurity Ion Diagnostics in the GAMMA 10 Plasma

M. Yoshikawa, Y. Okamoto, E. Kawamori, C. Watabe, Y. Watanabe, T. Furukawa, K. Ikeda, N. Yamaguchi, T. Tamano, K. Yatsu

Fusion Science and Technology / Volume 39 / Number 1T / January 2001 / Pages 289-292

Poster Presentations / dx.doi.org/10.13182/FST01-A11963463

Published:February 8, 2018

We constructed spectroscopic measurement systems that cover the wavelength range from soft X-ray (SX) to visible lights for impurity ion diagnostics in the GAMMA 10. We observed the absolute impurity line intensities, Doppler line broadening and time dependent radial profiles of the impurity ion emissions. We determined the radiation loss and impurity ion density in the GAMMA 10.