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In-Situ Observation of Sputtered Particles for Carbon Implanted Tungsten During Energetic Hydrogen Isotope Ion Implantation

Yasuhisa Oya, Misaki Sato, Hiromichi Uchimura, Naoko Ashikawa, Akio Sagara, Naoaki Yoshida, Yuji Hatano, Kenji Okuno

Fusion Science and Technology / Volume 67 / Number 3 / April 2015 / Pages 515-518

Proceedings of TRITIUM 2013 / dx.doi.org/10.13182/FST14-T68

First Online Publication:March 6, 2015
Updated:April 2, 2015

The effect of carbon implantation for the dynamic recycling of deuterium, which demonstrates tritium recycling, including retention and sputtering, was investigated using in-situ sputtered particle measurements. The C+ implanted W, WC and HOPG were prepared and dynamic sputtered particles were measured during H2 + irradiation. It was found that the major hydrocarbon species for C+ implanted tungsten was found to be CH3, although those for WC and HOPG were CH4. The chemical state of hydrocarbon is controlled by the H concentration in a W-C mixed layer. The amount of C-H bond and the retention of H trapped by carbon atom should control the chemical form of hydrocarbon sputtered by H2+ irradiation and the desorption of CH3 and CH2 was due to chemical sputtering, although that for CH was physical sputtering. The activation energy for CH3 desorption was estimated to be 0.4 eV, corresponding to the trapping process of hydrogen by carbon through the diffusion in W. It was concluded that the chemical states of hydrocarbon sputtered by H2+ irradiation for W was determined by the amount of C-H bond on the W surface.