Fast Measurement of Ion Temperature Using Filter Charge Exchange Recombination Spectroscopy System Towards Real-Time Plasma Control in JT-60U

M. Yoshida; S. Kobayashi; H. Takenaga; S. Sakata; Y. Kamada; JT-60 Team (19P32)

doi:dx.doi.org/10.13182/FST07-A1382

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Fast Measurement of Ion Temperature Using Filter Charge Exchange Recombination Spectroscopy System Towards Real-Time Plasma Control in JT-60U

M. Yoshida, S. Kobayashi, H. Takenaga, S. Sakata, Y. Kamada, JT-60 Team (19P32)

Fusion Science and Technology / Volume 51 / Number 2T / February 2007 / Pages 301-303

Technical Paper / Open Magnetic Systems for Plasma Confinement / dx.doi.org/10.13182/FST07-A1382

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A filter charge exchange recombination spectroscopy (CXRS) system has been developed for the real-time measurement and feedback control of ion temperature (Ti) profiles in JT-60U. In order to improve the dynamic range and the spatial coverage, the passband of each filter used for the fast CXRS diagnostic is optimized for the target value of Ti (~0.1-20 keV), and the number of relevant channels is increased (maximum: 12 channels). Real-time processor system has also been improved using advantage of the filter CXRS method. Utilizing this filter CXRS system, real-time control of the central Ti has been demonstrated.