Electrorheological Kelvin-Helmholtz Instability at the Interface Between a Nano Structured Porous Layer and Thin Shell with Poorly Conducting Couple Stress Fluid

This paper is concerned with the study of the Electrorheological Kelvin-Helmholtz Instability (EKHI) at the interface between a poorly conducting couple stress fluid saturated porous layer which is in relative motion with a poorly conducting couple stress fluid in a thin shell in the presence of a transverse electric field and laser radiation. A simple theory based on fully developed flow approximations is used to derive the dispersion relation for the growth rate of EKHI. The cutoff and the maximum wave numbers and the corresponding maximum frequencies are obtained. It is shown that the effects of couple stress parameter, laser radiation and the electric field reduce the growth rate of KHI considerably compared to a non-conducting fluid in the absence of an electric field. These are favorable to control the surface instabilities in many practical applications discussed in this paper.