A Novel Technique for Precisely Measuring the Thickness of Witness Plates

D. A. Steinman; R. B. Stephens; M. L. Hoppe

doi:dx.doi.org/10.13182/FST06-A1177

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Home / Publications / Journals / Fusion Science and Technology / Volume 49 / Number 4

A Novel Technique for Precisely Measuring the Thickness of Witness Plates

D. A. Steinman, R. B. Stephens, M. L. Hoppe

Fusion Science and Technology / Volume 49 / Number 4 / May 2006 / Pages 635-637

Technical Paper / Target Fabrication / dx.doi.org/10.13182/FST06-A1177

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White light interferometry has been adapted to the characterization of transparent and opaque witness plates for ICF and high energy physics experiments. An interferometric microscope, a precision z-stage, and a technique that minimizes optical dispersion allows determination of witness plate thickness to sub-micron precision. The hardware and methodology required for this measurement are described.